SRNL Deploys New Physical Properties Measurement System for Cost Savings, Increased Analytical Capabilities
Savannah River National Laboratory utilizes a variety of techniques in a key area of research known as materials optimization. This research involves understanding numerous characteristics of specific materials to know how they function best to utilize them for additional applications.
However, SRNL researchers faced challenges in advancing their materials optimization research due to equipment limitations. Existing instruments and systems lacked the ability to characterize physical properties of various materials, which is a critical component of new materials development.
SRNL Staff Scientist Binod Rai identified the need for a Physical Properties Measurement System to support the process of identifying material characteristics such as magnetic susceptibility, heat capacity, electrical and thermal transport and more.
DynaCool Physical Properties Measurement System by Quantum Design has been paired with a single crystal X-ray diffraction for materials characterization. Photo by Chance Briley (SRNS).
“We have established crystal growth techniques at SRNL to grow both radioactive and non-radioactive materials, and we have added single crystal X-ray diffraction for their characterization,” said Rai. “The addition of the DynaCool Physical Property Measurement System further enhances our capabilities, positioning us as a uniquely equipped laboratory for both radioactive and non-radioactive material characterization.”
The single crystal x-ray diffraction instrument allows any crystalline structure to be analyzed. Two different processes are applied for inserting the sample into the instrument. Non-radioactive materials are attached to a probe using immersion oils, while radioactive samples are coated with an adhesive to prevent potential contamination.
After the sample has been inserted into the instrument, x-rays refract against the sample and the resulting data identifies the crystalline structure.
Integrating this new Physical Property Measurement System into the current single crystal x-ray diffraction process expands SRNL’s material characterization abilities by introducing a variety of probes to accommodate solid sample types beyond crystalline structures. It also allows for the characterization of properties such as thermal and electrical conductivity, magnetic susceptibility and specific heat.
Compared to other methods of materials characterization, the coupling of the single crystal x-ray diffraction instrument with the new Physical Property Measurement System provides more detailed results quickly and requires less resources to operate.
SRNL staff scientist Binod Rai inserts a sample for testing into the DynaCool Physical Properties Measurement System. Photo by Chance Briley (SRNS).
In addition to the cost and processing time savings for current projects, the addition of the new Physical Property Measurement System opens opportunities for new projects and collaborations with the Department of Energy Office of Science and the National Nuclear Security Administration.
The coupling of the Physical Property Measurement System’s, variety of probes and the single crystal X-ray diffraction creates a unique set up capable of a wide range of material characterization. Parties interested in learning more about opportunities to leverage this capability can contact Binod Rai at binod.rai@srnl.doe.gov.